000 00998nam a2200241 a 4500
001 vtls000034199
003 KUKTEM
005 20251117145304.0
008 090128t2008 xxka f 001 0 eng d
020 _a9780863417450
039 9 _a201107132107
_bVLOAD
_c200908271254
_dkam
_c200908191226
_dfauzi
_c200908141645
_dfauzi
_y200901281422
_zsaini
040 _aUMP
090 _aTK7874.654 .T47 2008
245 0 0 _aTest and diagnosis of analogue, mixed-signal and RF integrated circuits :
_bthe system on chip approach /
_cedited by Yichuang Sun
260 _aLondon :
_bInstitution of Engineering and Technology ,
_c2008
300 _a389 p. :
_bill. ;
_c24 cm.
490 1 _aCircuits, devices and systems series ;
_v19
650 0 _aLinear integrated circuits
_xTesting
650 0 _aMixed signal circuits
_xTesting
650 0 _aRadio frequency integrated circuits
_xTesting
700 1 _aSun, Yichuang
999 _aVIRTUA40
_c43179
_d43185
999 _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*4900*6500*6501*6502*7000*9991