000 00995nam a2200265 a 4500
001 vtls000034462
003 KUKTEM
005 20251117145304.0
008 090212t2008 maua f b 001 0 eng d
020 _a9781856175302 (pbk.)
020 _a1856175308 (pbk.)
039 9 _a201107132109
_bVLOAD
_c201008031615
_dfauzi
_c200908141551
_dVLOAD
_c200908141523
_dVLOAD
_y200902120904
_zshah
040 _aUMP
090 _aTA410 .T47 2009
245 0 0 _aTest and measurement /
_cJon Wilson ... [et al.]
260 _aBurlington, Mass. :
_bNewnes/Elsevier,
_cc2009
300 _axviii, 891 p. :
_bill. ;
_c24 cm.
490 1 _aThe Newnes know it all series
504 _aIncludes bibliographical references and index
650 0 _aTesting
_vHandbooks, manuals, etc.
650 0 _aMeasurement
_vHandbooks, manuals, etc.
700 1 _aWilson, Jon S.
830 4 _aThe Newnes know it all series
999 _aVIRTUA40
_c43190
_d43196
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*7000*8300*9991