000 00974nam a2200277 a 4500
001 vtls000035733
003 KUKTEM
005 20251117145344.0
008 090429t2007 enkao f b 001 0 eng d
020 _a9781842653753
020 _a184265375X
039 9 _a201904301202
_bAUTHORITY
_c201605051123
_dzul
_c201605040950
_dtraining2
_c201107132121
_dVLOAD
_y200904291505
_znadia
040 _aUMP
090 _aTA417.2 .R35 2007
100 1 _aRaj, Baldev
245 1 0 _aPractical non-destructive testing /
_cBaldev Raj, T. Jayakumar, M. Thavasimuthu
250 _a3rd ed.
260 _aOxford, U.K. :
_bAlpha Science International Ltd,
_c2007
300 _axvi, 211 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index
650 0 _aNondestructive testing
700 1 _aJayakumar, T.
700 1 _aThavasimuthu, M.
999 _aVIRTUA40
_c44531
_d44537
999 _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2500*2600*3000*5040*6500*7000*7001*9992
942 0 0 _01