| 000 | 00931nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | vtls000032129 | ||
| 003 | KUKTEM | ||
| 005 | 20251117145357.0 | ||
| 008 | 081111t2007 maua f b 001 0 eng d | ||
| 020 | _a158053709X | ||
| 020 | _a9781580537094 | ||
| 039 | 9 |
_a201107132132 _bVLOAD _c200908141622 _dVLOAD _c200908141555 _dVLOAD _c200908132107 _dVLOAD _y200811111055 _zsaini |
|
| 040 | _aUMP | ||
| 090 | _aTK7895.E42 K45 2007 | ||
| 100 | 1 | _aKelly, Joe | |
| 245 | 1 | 0 |
_aAdvanced production testing of RF, SoC, and SiP devices / _cJoe Kelly, Michael Engelhardt |
| 260 |
_aBoston : _bArtech House, _cc2007 |
||
| 300 |
_axx, 301 p. : _bill. ; _c24 cm. |
||
| 440 | 0 | _aArtech House microwave library | |
| 500 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aSystems on a chip _xTesting |
|
| 700 | 1 | _aEngelhardt, Michael | |
| 999 |
_aVIRTUA40 _c44960 _d44966 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*4400*5000*6500*7000*9991 | ||