| 000 | 01116nam a2200277 a 4500 | ||
|---|---|---|---|
| 001 | vtls000032163 | ||
| 003 | KUKTEM | ||
| 005 | 20251117145402.0 | ||
| 008 | 081111t2006 nyua f 001 0 eng d | ||
| 020 | _a9780387307510 | ||
| 020 | _a0387307516 | ||
| 039 | 9 |
_a201107132132 _bVLOAD _c200908141622 _dVLOAD _c200908141556 _dVLOAD _c200908132108 _dVLOAD _y200811111601 _zsaini |
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| 040 | _aUMP | ||
| 090 | _aTK7895.E42 D75 2006 | ||
| 100 | 1 | _ada Silva, Francisco | |
| 245 | 1 | 4 |
_aThe core test wrapper handbook : _brationale and application of IEEE Std. 1500™ / _cby Francisco da Silva, Teresa McLaurin, Tom Waayers |
| 260 |
_aNew York : _bSpringer Science + Business Media , _c2006 |
||
| 300 |
_a276 p. : _bill. ; _c24 cm. |
||
| 440 | 0 |
_aFrontiers in electronic testing ; _v35 |
|
| 650 | 0 |
_aEmbedded computer systems _xTesting _xStandards |
|
| 650 | 0 |
_aSystems on a chip _xTesting _xStandards |
|
| 650 | 0 |
_aIntegrated circuits _xTesting _xStandards |
|
| 700 | 1 | _aMcLaurin, Teresa | |
| 700 | 1 | _aWaayers, Tom | |
| 999 |
_aVIRTUA40 _c45161 _d45167 |
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| 999 | _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*4400*6500*6501*6502*7000*7001*9991 | ||