000 01138nam a2200301 a 4500
001 vtls000045791
003 KUKTEM
005 20251117145444.0
008 100514t2008 ne a f b 001 0 eng d
020 _a9781402084195 (hbk.)
020 _a1402084196 (hbk.)
020 _a140208420X (e-ISBN)
020 _a9781402084201 (e-ISBN)
039 9 _a201107132152
_bVLOAD
_c201101201128
_dfauzi
_c201005201232
_dshikin
_y201005141049
_zsafura
040 _aUMP
090 _aTK7874 .N49 2008
245 0 0 _aNew methods of concurrent checking /
_cby Michael Goessel ... [et al.]
260 _aDordrecht ;
_aLondon :
_bSpringer,
_c2008
300 _aviii, 181 p. :
_bill. ;
_c24 cm.
490 1 _aFrontiers in electronic testing ;
_v42
504 _aIncludes bibliographical references and index
650 0 _aElectronic circuit design
650 0 _aError-correcting codes (Information theory)
650 0 _aConcurrent engineering
700 1 _aGössel, Michael
830 0 _aFrontiers in electronic testing ;
_v42
999 _aVIRTUA40
_c46610
_d46616
999 _aVTLSSORT0080*0200*0201*0202*0203*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*7000*8300*9991