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008 120522t1985 paua f b 101 0 eng d
020 _a9780931837067
020 _a0931837065
039 9 _a201302270949
_bjamie
_c201212121458
_dfauzi
_y201205221634
_zsafura
040 _aUMP
090 _aQD921 .A38 1985
245 1 0 _aAdvanced photon and particle techniques for the characterization of defects in solids :
_bsymposium held November 27-29, 1984, Boston, Massachusetts, U.S.A. /
_ceditors, J. B. Roberto, R. W. Carpenter, M. C. Wittels
260 _aPittsburgh, Pa. :
_bMaterials Research Society,
_cc1985
300 _axi, 390 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposia proceedings ;
_vv. 41
504 _aIncludes bibliographies and index
650 0 _aCrystals
_xDefects
_vCongresses
650 0 _aElectron microscopy
_vCongresses
650 0 _aProton beams
_vCongresses
650 0 _aParticle beams
_vCongresses
700 1 _aRoberto, J. B.
700 1 _aCarpenter, R. W.
700 1 _aWittels, M. C.
830 0 _aMaterials Research Society symposia proceedings
999 _aVIRTUA40
_c46702
_d46708
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*6503*7000*7001*7002*8300*9992