| 000 | 00848nam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | vtls000059924 | ||
| 003 | KUKTEM | ||
| 005 | 20251117145454.0 | ||
| 008 | 120522t2012 gw a f b 001 0 eng d | ||
| 020 | _a9783642201189 | ||
| 039 | 9 |
_a201207171609 _bjamie _y201205221035 _zfarina |
|
| 040 | _aUMP | ||
| 090 | _aTA417.23 .R66 2012 | ||
| 100 | 1 | _aRong, Yonghua | |
| 245 | 1 | 0 |
_aCharacterization of microstructures by analytical electron microscopy (AEM) / _cYonghua Rong |
| 260 |
_aBerlin : _bSpringer ; _aBeijing : _bHigher Education Press, _cc2012 |
||
| 300 |
_axviii, 552 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aNanostructured materials _xNondestructive testing |
|
| 650 | 0 | _aElectron microscopy | |
| 999 |
_aVIRTUA40 _c46932 _d46938 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*6501*9992 | ||