| 000 | 01031nam a2200265 a 4500 | ||
|---|---|---|---|
| 001 | vtls000048682 | ||
| 003 | KUKTEM | ||
| 005 | 20251117145512.0 | ||
| 008 | 101201t2010 nyua f 001 0 eng d | ||
| 020 | _a9781441909275 | ||
| 020 | _a1441909273 | ||
| 039 | 9 |
_a201108040926 _basmadi _c201108040925 _dasmadi _c201107221122 _dasmadi _c201107131836 _dVLOAD _y201012011124 _ztraining |
|
| 040 | _aUMP | ||
| 090 | _aTK7874 .P69 2010 | ||
| 245 | 0 | 0 |
_aPower-aware testing and test strategies for low power devices / _cPatrick Girard, Nicola Nicolici, Xiaoqing Wen, editors |
| 260 |
_aNew York : _bSpringer, _c2010 |
||
| 300 |
_axxiii, 363 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aLow voltage integrated circuits _xPower supply |
|
| 650 | 0 |
_aLow voltage integrated circuits _xTesting |
|
| 700 | 1 | _aGirard, Patrick | |
| 700 | 1 | _aNicolici, Nicola | |
| 700 | 1 | _aWen, Xiaoqing | |
| 999 |
_aVIRTUA40 _c47578 _d47584 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*5040*6500*6501*7000*7001*7002*9991 | ||