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|---|---|---|---|
| 001 | vtls000044150 | ||
| 003 | KUKTEM | ||
| 005 | 20251117145521.0 | ||
| 008 | 090914t2008 maua f b 001 0 eng d | ||
| 020 | _a026202649X (hardcover : alk. paper) | ||
| 020 | _a9780262026499 (hardcover : alk. paper) | ||
| 039 | 9 |
_a201107132214 _bVLOAD _c201008241217 _dfauzi _y200909141411 _zshikin |
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| 040 | _aUMP | ||
| 090 | _aQA76.76.V47 B35 2008 | ||
| 100 | 1 | _aBaier, Christel | |
| 245 | 1 | 0 |
_aPrinciples of model checking / _cChristel Baier, Joost-Pieter Katoen |
| 260 |
_aCambridge, Mass. : _bThe MIT Press, _c[2008?] |
||
| 300 |
_axvii, 975 p. : _bill. ; _c26 cm. |
||
| 504 | _aIncludes bibliographical references (p. 931-964) and index | ||
| 650 | 0 |
_aComputer systems _xVerification |
|
| 650 | 0 |
_aComputer software _xVerification |
|
| 700 | 1 | _aKatoen, Joost-Pieter | |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/toc/ecip0727/2007037603.html |
| 999 |
_aVIRTUA40 _c47909 _d47915 |
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