| 000 | 01008nam a2200277 a 4500 | ||
|---|---|---|---|
| 001 | vtls000041493 | ||
| 003 | KUKTEM | ||
| 005 | 20251117145546.0 | ||
| 008 | 090817t2009 nyua f 001 0 eng d | ||
| 020 | _a9780387095783 (pbk.) | ||
| 039 | 9 |
_a201107132231 _bVLOAD _c201006010804 _dida _y200908171707 _zshah |
|
| 040 | _aUMP | ||
| 090 | _aQC482.D5 P43 2009 | ||
| 100 | 1 | _aPecharsky, Vitalij K. | |
| 245 | 1 | 0 |
_aFundamentals of powder diffraction and structural characterization of materials / _cVitalij K. Pecharsky, Peter Y. Zavalij |
| 250 | _a2nd ed. | ||
| 260 |
_aNew York : _bSpringer, _cc2009 |
||
| 300 |
_axxiii, 741 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aX-rays _xDiffraction _xMeasurement |
|
| 650 | 0 |
_aPowders _xOptical properties _xMeasurement |
|
| 650 | 0 | _aX-ray crystallography | |
| 700 | 1 | _aZavalij, Peter Y. | |
| 999 |
_aVIRTUA40 _c48787 _d48793 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2500*2600*3000*5040*6500*6501*6502*7000*9991 | ||
| 942 | 0 | 0 | _01 |