000 01156nam a2200301 a 4500
001 vtls000034173
003 KUKTEM
005 20251117145606.0
008 090128t2007 enka f b 001 0 eng d
020 _a9780863417351
020 _a0863417353
039 9 _a201107132245
_bVLOAD
_c200908241044
_djamee
_c200908141548
_dVLOAD
_c200908141519
_dVLOAD
_y200901281058
_zsaini
040 _aUMP
090 _aTK7876 .M537 2007
245 0 0 _aMicrowave measurements /
_cedited by R.J. Collier and A.D. Skinner
250 _a3rd ed.
260 _aLondon :
_bInstitution of Engineering and Technology,
_c2007
300 _axx, 484 p. :
_bill. ;
_c24 cm.
490 1 _aIET electrical measurement series ; 12
500 _aPrevious ed.: London: Peter Peregrinus, 1989
504 _aIncludes bibliographical references and index
650 0 _aMicrowave measurements
700 1 _aCollier, R. J.
700 1 _aSkinner, A. Douglas.
710 2 _aInstitution of Engineering and Technology
830 0 _aIET electrical measurement series
999 _aVIRTUA40
_c49441
_d49447
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2500*2600*3000*4900*5000*5040*6500*7000*7001*7100*8300*9991