| 000 | 00851nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | vtls000043295 | ||
| 003 | KUKTEM | ||
| 005 | 20251117145609.0 | ||
| 008 | 090904t2009 njuda f 001 0 eng d | ||
| 020 | _a9780470380246 | ||
| 039 | 9 |
_a201107132248 _bVLOAD _c201009171122 _dFida _y200909040953 _znadia |
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| 040 | _aUMP | ||
| 090 | _aTS156.2 .S65 2009 | ||
| 100 | 1 | _aSmith, Cecil L. | |
| 245 | 1 | 0 |
_aBasic process measurements / _cCecil L. Smith |
| 260 |
_aHoboken, N.J. : _bWiley, _cc2009 |
||
| 300 |
_ax, 346 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aManufacturing processes _xMeasurement |
|
| 650 | 0 | _aEngineering inspection | |
| 650 | 0 | _aMeasurement | |
| 650 | 0 | _aPhysical measurements | |
| 999 |
_aVIRTUA40 _c49544 _d49550 |
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| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*6501*6502*6503*9991 | ||