| 000 | 00929nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | vtls000044810 | ||
| 003 | KUKTEM | ||
| 005 | 20251117145611.0 | ||
| 008 | 090930t2009 gw a f 001 0 eng d | ||
| 020 | _a3527323503 | ||
| 020 | _a9783527323500 | ||
| 039 | 9 |
_a201107132253 _bVLOAD _c201102091209 _dasmadi _c201102011614 _dasmadi _y200909300933 _zshikin |
|
| 040 | _aUMP | ||
| 090 | _aQD139.T7 T73 2010 | ||
| 245 | 0 | 0 |
_aTrace analysis with nanomaterials / _cedited by David T. Pierce and Julia Xiaojun Zhao |
| 260 |
_aWeinheim, Germany : _bWiley-VCH Verlag GmbH , _c2009 |
||
| 300 |
_axxi, 396 p. : _bill. (some col.) ; _c25 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aTrace analysis | |
| 650 | 0 | _aNanostructured materials | |
| 700 | 1 | _aPierce, David T. | |
| 700 | 1 | _aZhao, Julia Xiaojun | |
| 999 |
_aVIRTUA40 _c49616 _d49622 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*5040*6500*6501*7000*7001*9991 | ||