000 00942nam a2200253 a 4500
001 vtls000034509
003 KUKTEM
005 20260703093105.0
008 090216t2008 si a f b 001 0 eng d
020 _a9789812797339
020 _a9812797335
039 9 _a201107132257
_bVLOAD
_c200911050908
_dfauzi
_c200908141552
_dVLOAD
_c200908141524
_dVLOAD
_y200902161046
_zshah
040 _aUMP
090 _aQH212.E4 I52 2008
245 0 0 _aIn-situ electron microscopy at high resolution /
_ceditor, Florian Banhart
260 _aSingapore ;
_aHackensack, NJ :
_bWorld Scientific,
_cc2008
300 _avi, 311 p. :
_bill. (some col.) ;
_c24 cm.
504 _aIncludes bibliographical references and index
650 0 _aElectron microscopy
_xTechnique
650 0 _aHigh resolution electron microscopy
700 1 _aBanhart, Florian
999 _aVIRTUA40
_c50205
_d50211
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*5040*6500*6501*7000*9991
942 0 0 _01