000 01047nam a2200289 a 4500
001 vtls000037240
003 KUKTEM
005 20251117150039.0
008 090605t2009 nyua f 001 0 eng d
020 _a9780071621304 (alk. paper)
020 _a007162130X (alk. paper)
039 9 _a201107132257
_bVLOAD
_c200910301034
_dfauzi
_c200908141623
_dVLOAD
_c200908141557
_dVLOAD
_y200906051508
_zsaini
040 _aUMP
090 _aQA276.4 .B43 2009
100 1 _aBass, Issa
245 1 0 _aLean six sigma using SigmaXL and Minitab /
_cIssa Bass, Barbara Lawton
260 _aNew York :
_bMcGraw-Hill,
_cc2009
300 _axv, 362 p. :
_bill. ;
_c24 cm.
500 _aIncludes index
505 0 _aDefine -- Measure -- Analyze -- Improve -- Control
630 0 0 _aMinitab
650 0 _aCritical path analysis
650 0 _aSix sigma (Quality control standard)
650 0 _aStatistics
_vSoftware
700 1 _aLawton, Barbara
999 _aVIRTUA40
_c50292
_d50298
999 _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*5000*5050*6300*6500*6501*6502*7000*9991