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|---|---|---|---|
| 001 | vtls000037574 | ||
| 003 | KUKTEM | ||
| 005 | 20251117150041.0 | ||
| 008 | 090610t2008 enka f 001 0 eng d | ||
| 020 | _a9780470027844 | ||
| 039 | 9 |
_a201107132259 _bVLOAD _c200911160940 _dkam _c200908141627 _dVLOAD _c200908141601 _dVLOAD _y200906101202 _znadia |
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| 040 | _aUMP | ||
| 090 | _aTA417.23 .B73 2008 | ||
| 100 | 1 | _aBrandon, David | |
| 245 | 1 | 0 |
_aMicrostructural characterization of materials / _cDavid Brandon and Wayne D. Kaplan |
| 250 | _a2nd ed. | ||
| 260 |
_aChichester, England: _bJohn Wiley & Sons, _c2008 |
||
| 300 |
_a536 p. : _bill. ; _c25 cm. |
||
| 650 | 0 |
_aMaterials _xMicroscopy |
|
| 650 | 0 | _aMicrostructure | |
| 700 | 1 | _aKaplan, Wayne D. | |
| 999 |
_aVIRTUA40 _c50346 _d50352 |
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