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008 090804t2009 njua f 001 0 eng d
020 _a9789812839510
020 _a9812839518
039 9 _a201112131051
_bamelia
_c201112131050
_damelia
_c201112131050
_damelia
_c201107132314
_dVLOAD
_y200908041158
_zshah
040 _aUMP
090 _aQA465 .A43 2009
111 2 _aAMCTM VIII
_d(2008 : œ
_cParis, France)
245 1 0 _aAdvanced mathematical & computational tools in metrology & testing VIII/
_ceditors, F. Pavese ... [et al.]
260 _aNew Jersey :
_bWorld Scientific ,
_c2009
300 _axii, 406 p. :
_bill. ;
_c24 cm.
490 1 _aSeries on advances in mathematics for applied sciences ;
_vv. 78
504 _aIncludes bibliographical references and index
650 0 _aMeasurement
_vCongresses
650 0 _aPhysical measurements
_vCongresses.
650 0 _aMetrology
_vCongresses.
700 1 _aPavese, Franco
830 0 _aSeries on advances in mathematics for applied sciences ;
_vv. 78.
999 _aVIRTUA40
_c51668
_d51674
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