000 01168nam a2200289 a 4500
001 vtls000062331
003 KUKTEM
005 20251117150126.0
008 120618t1989 paua f b 001 0 eng d
020 _a9781558990159
020 _a1558990151
039 9 _a201303061132
_bjamie
_y201206181623
_zsafura
040 _aUMP
090 _aTA417.2 .N66 1989
245 0 0 _aNondestructive monitoring of materials properties :
_bsymposium held November 28-30, 1988, Boston, Massachusetts, U.S.A. /
_ceditors by John Holbrook, Jean Bussiere
260 _aPittsburgh, PA :
_bMaterials Research Society,
_cc1989
300 _ax, 374 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposium proceedings ;
_vv. 142
504 _aIncludes bibliographical references and index
650 0 _aNondestructive testing
_xCongresses
650 0 _aMaterials
_xTesting
_xCongresses
700 1 _aHolbrook, John
700 1 _aBussière, Jean
710 2 _aMaterials Research Society
830 0 _aMaterials Research Society symposium proceedings
999 _aVIRTUA40
_c51930
_d51936
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*7000*7001*7100*8300*9992