000 01094nam a2200277 a 4500
001 vtls000060344
003 KUKTEM
005 20251117150144.0
008 120525t1985 paua f b 001 0 eng d
020 _a9780931837135
020 _a0931837138
039 9 _a201212061025
_bfauzi
_y201205251522
_zsafura
040 _aUMP
090 _aTA410 .A67 1985
245 0 0 _aApplied materials characterization :
_bsymposium held April 15-18, 1985, San Francisco, California, U.S.A. /
_ceditors, W. Katz, P. Williams
260 _aPittsburgh, Pa. :
_bMaterials Research Society,
_cc1985
300 _axiii, 483 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposia proceedings,
_x0272-9172 ;
_vv. 48
500 _aIncludes bibliographies and indexes
650 0 _aMaterials
_xTesting
_vCongresses
650 0 _aMaterials
_xAnalysis
_vCongresses
700 1 _aKatz, W.
700 1 _aWilliams, P.
830 0 _aMaterials Research Society symposia proceedings ;
_vv. 48
999 _aVIRTUA40
_c52576
_d52582
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5000*6500*6501*7000*7001*8300*9992