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| 001 | vtls000041735 | ||
| 003 | KUKTEM | ||
| 005 | 20251117150147.0 | ||
| 008 | 090819t2008 enk f 001 0 eng d | ||
| 020 | _a9781420080827 | ||
| 039 | 9 |
_a201107132330 _bVLOAD _c201006241443 _dFida _c201006241442 _dFida _y200908191250 _zsafura |
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| 040 | _aUMP | ||
| 090 | _aTA169 .E67 2008 | ||
| 100 | 1 | _aEpstein, Benjamin | |
| 245 | 1 | 0 |
_aMathematical models for systems reliability / _cBenjamin Epstein and Ishay Weissman |
| 260 |
_aBoca Raton : _bCRC Press , _cc2008 |
||
| 300 |
_a253 p. : _bill. ; _c25 cm |
||
| 500 | _a"A Chapman & Hall book." | ||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aReliability (Engineering) _xMathematics |
|
| 650 | 0 |
_aSystem failures (Engineering) _xMathematical models |
|
| 700 | 1 | _aWeissman, Ishay | |
| 999 |
_aVIRTUA40 _c52666 _d52672 |
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