| 000 | 01282nam a2200301 a 4500 | ||
|---|---|---|---|
| 001 | vtls000041703 | ||
| 003 | KUKTEM | ||
| 005 | 20251117150201.0 | ||
| 008 | 090819t2008 si a f b 100 0 eng d | ||
| 020 | _a9789812790163 (set) | ||
| 020 | _a9812790160 (set) | ||
| 020 | _a9789812790170 (vol. 1) | ||
| 020 | _a9812790179 (vol. 1) | ||
| 020 | _a9789812790187 (vol. 2) | ||
| 020 | _a9812790187 (vol. 2) | ||
| 039 | 9 |
_a201107132340 _bVLOAD _c201008031419 _dfauzi _y200908191051 _zsafura |
|
| 040 | _aUMP | ||
| 090 | _aTA417.2 .I57 2008 | ||
| 111 | 2 |
_aInternational Conference on Advanced Nondestructive Testing _n(2nd : _d2007 : _cPusan, Korea) |
|
| 245 | 1 | 0 |
_aAdvanced nondestructive evaluation II : _bproceedings of the International Conference on ANDE 2007, the 2nd International Conference on Advanced Nondestructive Testing / _ceditors, Seung-Seok Lee ... [et al.] |
| 260 |
_aSingapore ; _aHackensack, N.J. : _bWorld Scientific, _cc2008 |
||
| 300 |
_a2 v. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references | ||
| 650 | 0 |
_aNondestructive testing _vCongresses |
|
| 650 | 0 |
_aMaterials science _vCongresses |
|
| 700 | 1 | _aLee, Seung-Seok | |
| 999 |
_aVIRTUA40 _c53165 _d53171 |
||
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