000			04349nam a2200265 a 4500
001			vtls000060702
003			KUKTEM
005			20251117150314.0
008			120531t2011 a f 001 0 eng d
020			_a9780470405086
039		9	_a201210011212 _basmadi _y201205311055 _zirma
040			_aUMP
090			_aTA340 .M48 2011
245	0	0	_aMethods and applications of statistics : _bengineering, quality control, and the physical sciences / _cN. Balakrishnan, [editor]
260			_aHoboken, N.J. : _bWiley, _c2011
300			_axxii, 750 p. : _bill. ; _c26 cm.
500			_aIncludes index
505	0		_aMachine generated contents note: Contributors. -- Preface. -- 1. Accelerated Life Testing. -- 2. Advances in Robust Parameter Design: From Taguchi’s Inner-Outer Arrays to Combined Arrays. -- 3. Applicability of Statistics and Probability Theory to Nucleate Pool Boiling Heat Transfer. -- 4. Application of Statistics in International Standardization. -- 5. Capability. -- 6. Change-Point Analysis. -- 7. Chaos. -- 8. Chemometrics. -- 9. Coherent Structure Theory. -- 10. Control Charts. -- 11. Cumulative Sum Control Charts. -- 12. Degradation Models and Analyses. -- 13. Detection in Communication and Radar. -- 14. Directional Statistics. -- 15. Directional Statistics. -- 16. Engineering Statistics. -- 17. Fractal Dimensions and Estimation. -- 18. Fractals. -- 19. Hausdorff Dimension. -- 20. Information Theory and Coding Theory. -- 21. Life Testing. -- 22. Load-Sharing Systems. -- 23. Multivariate Calibration. -- 24. Multivariate Quality Control. -- 25. Nonparametric Methods in Reliability. -- 26. Optimal Sample Size Allocation for Accelerated Degradation Test Based on Weiner Process. -- 27. Optimal Stochastic Control. -- 28. Percolation Theory. -- 29. Power Law Process. -- 30. Precedence Testing. -- 31. Principles of Professional Statistical Practice. -- 32. Probabilistic Reliability. -- 33. Quality Concept for Official Statistics. -- 34. Quality Measurement Plan (QMP). -- 35. Quantum Mechanics and Probability: An Overview. -- 36. Quantum Mechanics: Statistical Interpretation. -- 37. Rainfall, Landforms, and Streamflow. -- 38. Repairable Systems in Reliability. -- 39. Sampling Plans. -- 40. Software Reliability. -- 41. Statistical Communication Theory. -- 42. Statistical Methods in Chemistry. -- 43. Statistical Models for Damage Accumulation. -- 44. Statistical Quality Control. -- 45. Statistical Signal Processing. -- 46. Statistical Software. -- 47. Statistics in Astronomy. -- 48. Statistics in Computer Vision. -- 49. Statistics in Crystallography. -- 50. Statistics in Industry. -- 51. Statistics in Meteorology. -- 52. Statistics in Physics (Early History). -- 53. Statistics of Earthquakes. -- 54. Step-Stress. -- 55. Stochastic Mechanics. -- 56. System Reliability. -- 57. Taguchi Method for Off-Line Quality Control. -- 58. Tolerance Intervals and Tolerance Regions. -- 59. Wavelets. -- References. -- Index
520			_a"Inspired by the Encyclopedia of Statistical Sciences, Second Edition (ESS2e), this volume presents a concise, well-rounded focus on the statistical concepts and applications that are essential for understanding gathered data in the fields of engineering, quality control, and the physical sciences. The book successfully upholds the goals of ESS2e by combining both previously-published and newly developed contributions written by over 100 leading academics, researchers, and practitioner in a comprehensive, approachable format. The result is a succinct reference that unveils modern, cutting-edge approaches to acquiring and analyzing data across diverse subject areas within these three disciplines, including operations research, chemistry, physics, the earth sciences, electrical engineering, and quality assurance. In addition, techniques related to survey methodology, computational statistics, and operations research are discussed, where applicable. Topics of coverage include: optimal and stochastic control, artificial intelligence, quantum mechanics, and fractals"-- _cProvided by publisher
650		0	_aEngineering _xStatistical methods
650		0	_aQuality control _xStatistical methods
650		0	_aStatistical physics
700	1		_aBalakrishnan, N.
999			_aVIRTUA40 _c55660 _d55666
999			_aVTLSSORT0080*0200*0400*0900*2450*2600*3000*5000*5050*5200*6500*6501*6502*7000*9992