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|---|---|---|---|
| 001 | vtls000043466 | ||
| 003 | KUKTEM | ||
| 005 | 20251117150331.0 | ||
| 008 | 090908t2009 flua f b 001 0 eng d | ||
| 020 | _a9781574446975 (hardcover : alk. paper) | ||
| 020 | _a1574446975 (hardcover : alk. paper) | ||
| 039 | 9 |
_a201107140032 _bVLOAD _c201102011237 _dfauzi _y200909081109 _zsafura |
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| 040 | _aUMP | ||
| 090 | _aQC367 .S57 2009 | ||
| 100 | 1 | _aSirohi, R. S. | |
| 245 | 1 | 0 |
_aOptical methods of measurement : _bwholefield techniques / _cRajpal S. Sirohi |
| 250 | _a2nd ed. | ||
| 260 |
_aBoca Raton : _bCRC Press, _cc2009 |
||
| 300 |
_axxvi, 290 p. : _bill. ; _c25 cm. |
||
| 490 | 1 |
_aOptical science and engineering ; _v146 |
|
| 504 | _aIncludes bibliographical references and index | ||
| 505 | 0 | _aWaves and beams -- Optical interference -- Diffraction -- Phase-evaluation methods -- Detectors and recording materials -- Holographic interferometry -- Speckle metrology -- Photoelasticity -- The Moiré phenomenon | |
| 650 | 0 | _aOptical measurements | |
| 830 | 0 |
_aOptical science and engineering (Boca Raton, Fla.) ; _v146 |
|
| 999 |
_aVIRTUA40 _c56236 _d56242 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2500*2600*3000*4900*5040*5050*6500*8300*9991 | ||