000 01153nam a2200277 a 4500
001 vtls000061986
003 KUKTEM
005 20251117150358.0
008 120615t1993 paua f b 001 0 eng d
020 _a9781558992054
020 _a1558992057
039 9 _a201307101455
_bjamie
_y201206151048
_zsafura
040 _aUMP
090 _aTK7874 .M38 1993
245 0 0 _aMaterials reliability in microelectronics III :
_bsymposium held April 12-15, 1993, San Francisco, California, U.S.A. /
_ceditors by Kenneth P. Rodbell ... [et al.]
260 _aPittsburgh, PA :
_bMaterials Research Society,
_cc1993
300 _axi, 497 p. :
_bill. ;
_c24 cm.
490 0 _aMaterials Research Society symposium proceedings ;
_vv. 309
504 _aIncludes bibliographical references and index
650 0 _aMicroelectronics
_xReliability
_xCongresses
650 0 _aMicroelectronics
_xMaterials
_xTesting
_xCongresses
650 0 _aElectrodiffusion
_xCongresses
650 0 _aMicrostructure
_xCongresses
_vCongresses
700 1 _aRodbell, Kenneth P.
999 _aVIRTUA40
_c57149
_d57155
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*6503*7000*9992