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| 001 | vtls000052742 | ||
| 003 | KUKTEM | ||
| 005 | 20251117150402.0 | ||
| 008 | 110411t2010 njua f 001 0 eng d | ||
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| 040 | _aUMP | ||
| 090 | _aQA76.76.S65 A27 2010 | ||
| 100 | 1 | _aAbran, Alain | |
| 245 | 1 | 0 |
_aSoftware metrics and software metrology / _cAlain Abran |
| 260 |
_aHoboken, N.J. : _bWiley , _c2010 |
||
| 300 |
_axix, 328 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aSoftware measurement _xDesign |
|
| 650 | 0 |
_aSoftware measurement _xDesign _vCase studies |
|
| 999 |
_aVIRTUA40 _c57284 _d57290 |
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