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| 001 | vtls000052757 | ||
| 003 | KUKTEM | ||
| 005 | 20251117150402.0 | ||
| 008 | 110411t2010 njua f 001 0 eng d | ||
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| 040 | _aUMP | ||
| 090 | _aTA417.25 .P37 2010 | ||
| 100 | 1 | _aPastorino, Matteo | |
| 245 | 1 | 0 |
_aMicrowave imaging / _cMatteo Pastorino |
| 260 |
_aHoboken, N.J. : _bJohn Wiley, _cc2010 |
||
| 300 |
_aviii, 285 p. : _bill. ; _c25 cm. |
||
| 490 | 0 | _aWiley series in microwave and optical engineering | |
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aMicrowave imaging _xIndustrial applications |
|
| 650 | 0 | _aNondestructive testing | |
| 650 | 0 | _aRadiography, Industrial | |
| 999 |
_aVIRTUA40 _c57303 _d57309 |
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