| 000 | 01785nam a2200349 a 4500 | ||
|---|---|---|---|
| 001 | vtls000033324 | ||
| 003 | KUKTEM | ||
| 005 | 20251117150432.0 | ||
| 008 | 081202t2008 njua f 001 0 eng d | ||
| 020 | _a0131860062 (pbk. : alk. paper) | ||
| 020 | _a9780131860063 | ||
| 039 | 9 |
_a201107132101 _bVLOAD _c200908241602 _dfauzi _c200908141540 _dVLOAD _c200908141511 _dVLOAD _y200812021245 _znadia |
|
| 040 | _aUMP | ||
| 090 | _aTK7870.23 .L39 2008 | ||
| 100 | 1 | _aLawday, Geoff | |
| 245 | 1 | 2 |
_aA signal integrity engineer's companion : _breal-time test and measurement and design simulation / _cGeoff Lawday, David Ireland, and Greg Edlund |
| 260 |
_aUpper Saddle River, NJ : _bPrentice Hall, _cc2008 |
||
| 300 |
_axxxi, 460 p. : _bill. ; _c25 cm. |
||
| 490 | 1 | _aPrentice Hall modern semiconductor design series | |
| 500 | _aIncludes index | ||
| 505 | 0 | _aChip-to-chip timing and simulation -- Signal path analysis as a signal integrity -- DDR2 case study -- Real-time measurements : probing -- Testing and debugging : oscilloscopes and logic analysers -- Replicating real-world signals with signal sources -- Signal analysis and compliance -- PCI express case study -- The wireless signal | |
| 650 | 0 |
_aElectronic apparatus and appliances _xTesting |
|
| 650 | 0 |
_aElectronic apparatus and appliances _xDesign and construction |
|
| 650 | 0 |
_aSignal processing _xSimulation methods |
|
| 650 | 0 |
_aSwitching circuits _xReliability |
|
| 650 | 0 |
_aOscillators, Electric _xTesting |
|
| 650 | 0 | _aSignal integrity (Electronics) | |
| 700 | 1 | _aIreland, David | |
| 700 | 1 | _aEdlund, Greg | |
| 830 | 0 | _aPrentice Hall modern semiconductor design series | |
| 999 |
_aVIRTUA40 _c58281 _d58287 |
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| 999 | _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*4900*5000*5050*6500*6501*6502*6503*6504*6505*7000*7001*8300*9991 | ||