| 000 | 00930nam a2200229 4500 | ||
|---|---|---|---|
| 001 | vtls000008343 | ||
| 003 | KUKTEM | ||
| 005 | 20251117150435.0 | ||
| 008 | 060606t2004 xxu gr |0 1 0|eng | | ||
| 020 | _a352740502X | ||
| 039 | 9 |
_a201205081203 _bFida _c201107131732 _dVLOAD _c200908141105 _dVLOAD _c200908141037 _dVLOAD _y200606141139 _zVLOAD |
|
| 040 | _aUMP | ||
| 090 | _aT174.7 .N36 2005 | ||
| 245 | 0 | 0 |
_aNanoscale calibration standards and methods : _bdimensional and related measurements in the micro- and nanometer range / _cedited by Gunter Wilkening, Ludger Koenders |
| 260 |
_aWeinheim, Germany : _bWiley-VCH, _c2005 |
||
| 300 |
_axxii, 518 p. : _bill. ; _c25 cm. |
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| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aNanotechnology | |
| 700 | 1 | _aWilkening, Gunter | |
| 700 | 1 | _aKoenders, Ludger | |
| 999 |
_aVIRTUA _c58408 _d58414 |
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| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*5040*6500*7000*7001*9991 | ||