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008 090909t2005 sz a f 001 0 eng d
020 _a3908451132
020 _a9783908451136
039 9 _a201107132249
_bVLOAD
_c201104191429
_dida
_y200909091035
_zfaiz
040 _aUMP
090 _aTK7871.85 .A98 2005
111 2 _aInternational Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology"
_n(11th :
_d2005 :
_cGiens, France)
245 1 0 _aProceeding of the 11th International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology :
_bGADEST 2005, Giens, France, September 25-30, 2005
246 3 _aGettering and Defect Engineering in Semiconductor Technology
260 _aUetikon-Zurich, Switzerland :
_bTrans Tech Pub.,
_cc2005
300 _axvi, 814 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index
650 0 _aSemiconductors
_vCongresses
650 0 _aGetters
_vCongresses
650 0 _aSilicon crystals
_xDefects
_vCongresses
650 0 _aElectrical engineering
_xMaterials
_vCongresses
700 1 _aPichaud, B.
999 _aVIRTUA40
_c58560
_d58566
999 _aVTLSSORT0080*0200*0201*0400*0900*1110*2450*2460*2600*3000*5040*6500*6501*6502*6503*7000*9991