000 01102nam a2200313 a 4500
001 vtls000056183
003 KUKTEM
005 20251117150505.0
008 111121t2012 nyua f 001 0 eng d
020 _a9780073529578
020 _a0073529575
020 _a9780071317061 (international ed. : pbk.)
020 _a0071317066 (international ed. : pbk.)
039 9 _a201203011257
_bida
_c201202211620
_dasmadi
_y201111211248
_zsri
040 _aUMP
090 _aTK454 .H39 2012
100 1 _aHayt, William Hart
245 1 0 _aEngineering circuit analysis /
_cWilliam H. Hayt, Jr., Jack E. Kemmerly, Steven M. Durbin
250 _a8th ed.
260 _aNew York :
_bMcGraw-Hill,
_c2012
300 _axxi, 852 p. :
_bill. (some col.) ;
_c26 cm.
504 _aIncludes bibliographical references and index
650 0 _aElectric circuit analysis
650 0 _aElectric network analysis
700 1 _aKemmerly, Jack E.
700 1 _aDurbin, Steven M.
999 _aVIRTUA40
_c59378
_d59384
999 _aVTLSSORT0080*0200*0201*0202*0203*0400*0900*1000*2450*2500*2600*3000*5040*6500*6501*7000*7001*9991
942 0 0 _02