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|---|---|---|---|
| 001 | vtls000057075 | ||
| 003 | KUKTEM | ||
| 005 | 20251117150515.0 | ||
| 008 | 111212t2011 gw a f b 000 0 eng d | ||
| 020 | _a9783642202322 | ||
| 020 | _a9783642202339 (electronic bk.) | ||
| 039 | 9 |
_a201202241630 _bfauzi _y201112121408 _zsafura |
|
| 040 | _aUMP | ||
| 090 | _aTA417.36 .C38 2011 | ||
| 100 | 1 | _aCataldo, Andrea | |
| 245 | 1 | 0 |
_aBroadband reflectometry for enhanced diagnostics and monitoring applications / _cAndrea Cataldo, Egidio de Benedetto, Giuseppe Cannazza |
| 260 |
_aBerlin ; _aHeidelberg : _bSpringer, _cc2011 |
||
| 300 |
_axviii, 148 p. : _bill ; _c24 cm. |
||
| 490 | 1 |
_aLecture notes in electrical engineering ; _vvol. 93 |
|
| 504 | _aIncludes bibliographical references | ||
| 650 | 0 | _aElectromagnetic testing | |
| 650 | 0 | _aNondestructive testing | |
| 700 | 1 | _aDe Benedetto, Egidio | |
| 700 | 1 | _aCannazza, Giuseppe | |
| 830 | 0 |
_aLecture notes in electrical engineering ; _vv. 93 |
|
| 999 |
_aVIRTUA40 _c59751 _d59757 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*4900*5040*6500*6501*7000*7001*8300*9991 | ||