000 01088nam a2200265 a 4500
001 vtls000062376
003 KUKTEM
005 20251125093045.0
008 120619t2000 da g 001 0 eng d
020 _a9781558994966
020 _a1558994963
039 9 _a201305151006
_bhuda
_y201206191102
_zsafura
040 _aUMP
090 _aQC610.9 .O68 2000
245 0 0 _aOptical microstructural characterization of semiconductors :
_bsymposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. /
_ceditors, M. Selim Unlu ... [et al.]
260 _aWarrendale, PA :
_bMaterials Research Society,
_c2000
300 _axi, 333 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposium proceedings ;
_vv. 588
504 _aIncludes bibliographical references and indexes
650 0 _aSemiconductors
_vCongresses
650 0 _aMicrostructure
_vCongresses
700 1 _aUnlu, M. Selim
830 0 _aMaterials Research Society symposium proceedings ;
_vv. 588
999 _aVIRTUA40
_c60972
_d60978
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*7000*8300*9992