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008 120523t1991 paua f 101 0 eng d
020 _a9781558991002
020 _a155899100X
039 9 _a201212061451
_bfauzi
_y201205231142
_zsafura
040 _aUMP
090 _aQC176.84.S93 A38 1991
245 0 0 _aAdvances in surface and thin film diffraction :
_bsymposium held November 27-29, 1990, Boston, Massachusetts, U.S.A. /
_ceditors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham
260 _aPittsburgh, Pa. :
_bMaterials Research Society,
_cc1991
300 _axiii, 367 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposium proceedings,
_x0272-9172 ;
_vv. 208
504 _aIncludes bibliographical references and index
650 0 _aThin films
_xSurfaces
_vSurfaces
_vCongresses
650 0 _aThin films
_xOptical properties
_vCongresses
650 0 _aDiffraction
_vCongresses
700 1 _aHuang, Ting C.
700 1 _aCohen, Philip I.
700 1 _aEaglesham, David J.
710 2 _aMaterials Research Society
830 0 _aMaterials Research Society symposia proceedings ;
_vv. 208
999 _aVIRTUA40
_c61362
_d61368
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*7000*7001*7002*7100*8300*9992