000			02738nam a2200325 a 4500
001			vtls000051861
003			KUKTEM
005			20251125093118.0
008			110311t2011 njua f 001 0 eng d
020			_a9780470250020
039		9	_a201206081005 _basmadi _c201205251043 _dasmadi _c201107131641 _dVLOAD _y201103111002 _zirma
040			_aUMP
090			_aTK7870.23 .S84 2011
100	1		_aSuhir, Ephraim
245	1	0	_aStructural dynamics of electronic and photonic systems / _cedited by Ephraim Suhir, David S. Steinberg, T. X. Yu
260			_aHoboken, N.J. : _bWiley, _c2011
300			_ax, 598 p. : _bill. ; _c25 cm.
504			_aIncludes bibliographical references and index
520			_a"The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading. Particular attention will be given to portable devices and systems designed for operation in harsh environments (such as automotive, aerospace, military, etc.) In-depth discussion from a mechanical engineer’s viewpoint will be conducted to the key components’ level as well as the whole device level. Both theoretical (analytical and computer-aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components may be affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice"-- _cProvided by publisher
520			_a"The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading"-- _cProvided by publisher
650		0	_aElectronic apparatus and appliances _xReliability
650		0	_aOptoelectronic devices _xReliability
650		0	_aFault tolerance (Engineering)
650		0	_aMicrostructure
650		0	_aStructural dynamics
700	1		_aSuhir, Ephraim
700	1		_aYu, T. X.
700	1		_aSteinberg, Dave S.
999			_aVIRTUA40 _c61504 _d61510
999			_aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*5200*5201*6500*6501*6502*6503*6504*7000*7001*7002*9991