| 000 | 00890nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | vtls000066483 | ||
| 003 | KUKTEM | ||
| 005 | 20251125093238.0 | ||
| 008 | 121119t2012 njua g bi 001 0 eng d | ||
| 020 | _a9780470454657 (hbk) | ||
| 020 | _a0470454652 | ||
| 039 | 9 |
_a201302271405 _bsafura _y201211191220 _znadia |
|
| 040 | _aUMP | ||
| 090 | _aTS173 .K59 2012 | ||
| 100 | 1 | _aKlyatis, Lev M. | |
| 245 | 1 | 0 |
_aAccelerated reliability and durability testing technology / _cLev M. Klyatis |
| 260 |
_aHoboken, N.J. : _bWiley, _cc2012 |
||
| 300 |
_axviii, 411 p. : _bill. ; _c25 cm. |
||
| 490 | 0 | _aWiley series in systems engineering and management | |
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aReliability (Engineering) | |
| 650 | 0 | _aAccelerated life testing | |
| 999 |
_aVIRTUA40 _c62835 _d62841 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*4900*5040*6500*6501*9992 | ||