000 01283nam a2200301 a 4500
001 vtls000061992
003 KUKTEM
005 20251125093516.0
008 120615t1996 paua f b 001 0 eng d
020 _a9781558993310
020 _a1558993312
039 9 _a201303141022
_bjamie
_c201303061036
_djamie
_y201206151103
_zsafura
040 _aUMP
090 _aTK7874 .M38 1996
245 0 0 _aMaterials reliability in microelectronics VI :
_bsymposium held April 8-12, 1996, San Francisco, California, U.S.A. /
_ceditors by William F. Filter ... [et al.]
260 _aPittsburgh, PA :
_bMaterials Research Society,
_cc1996
300 _axv, 583 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposium proceedings ;
_vv. 428
504 _aIncludes bibliographical references and index
650 0 _aMicroelectronics
_xReliability
_xCongresses
650 0 _aMicroelectronics
_xMaterials
_xTesting
_xCongresses
650 0 _aMicrostructure
_xCongresses
_vCongresses
650 0 _aMetallizing
_xCongresses
700 1 _aFilter, William F.
710 2 _aMaterials Research Society
830 0 _aMaterials Research Society symposium proceedings
999 _aVIRTUA40
_c65456
_d65462
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*6503*7000*7100*8300*9992