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008 120611t1990 paua f 001 0 eng d
020 _a9781558990722
020 _a1558990720
039 9 _a201304021151
_bsaini
_y201206111151
_zsafura
040 _aUMP
090 _aTA417.23 .H54 1990
245 0 0 _aHigh resolution electron microscopy of defects in materials :
_bsymposium held April 16-18, 1990, San Francisco, California, U.S.A. /
_ceditors, Robert Sinclair, David J. Smith, Ulrich Dahmen
260 _aPittsburgh, Pa. :
_bMaterials Research Society,
_c1990
300 _axi, 391 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposium proceedings,
_x0272-9172 ;
_vv. 183
504 _aIncludes bibliographical references and indexes
650 0 _aMaterials
_xMicroscopy
_vCongresses
650 0 _aMaterials
_xDefects
_vCongresses
650 0 _aHigh resolution electron microscopy
_vCongresses
700 1 _aSinclair, Robert
700 1 _aSmith, David J.
700 1 _aDahmen, Ulrich
710 2 _aMaterials Research Society
830 0 _aMaterials Research Society symposia proceedings ;
_vv. 183
999 _aVIRTUA40
_c65652
_d65658
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*7000*7001*7002*7100*8300*9992