| 000 | 00835nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | vtls000069978 | ||
| 003 | KUKTEM | ||
| 005 | 20251125093649.0 | ||
| 008 | 130531t2013 nyua f 001 0 eng d | ||
| 020 | _a9780071754279 (hbk. : alk. paper) | ||
| 039 | 9 |
_a201401101517 _bsaini _y201305311617 _zida |
|
| 040 | _aUMP | ||
| 090 | _aTK7871.85 .G36 2013 | ||
| 100 | 1 | _aGan, Zhenghao | |
| 245 | 1 | 0 |
_aSemiconductor process reliability in practice / _cGan, Zhenghao, Wong Waisum and Liou Juin |
| 260 |
_aNew York : _bMcGraw-Hill, _c2013 |
||
| 300 |
_axv, 605 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aSemiconductors _xReliability |
|
| 700 | 1 | _aWong, Waisum | |
| 700 | 1 | _aLiou, Juin J. | |
| 999 |
_aVIRTUA40 _c66892 _d66898 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*7000*7001*9992 | ||