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001 vtls000060873
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008 120601t1997 pauao f 001 0 eng d
020 _a978155899373
020 _a1558993738
039 9 _a201304101301
_bhuda
_y201206011130
_zsafura
040 _aUMP
090 _aTK7871.85 .D44 1997
245 0 0 _aDefects and diffusion in silicon processing :
_bsymposium held April 1-4, 1997, San Francisco, California, U.S.A. /
_ceditors, Tomas Diaz de la Rubia ... [et al.]
260 _aPittsburgh, PA :
_bMaterials Research Society,
_c1997
300 _axv, 541 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposium proceedings ;
_vv. 469
504 _aIncludes bibliographical references and index
650 0 _aSemiconductors
_xDefects
_xCongresses
650 0 _aSemiconductor doping
_xCongresses
650 0 _aSilicon crystals œx Defects
_xCongresses
700 1 _aDiaz de la Rubia, Tomas
830 0 _aMaterials Research Society symposia proceedings ;
_vv. 469
999 _aVIRTUA40
_c66948
_d66954
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*7000*8300*9992