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008 120615t2009 paudao f 001 0 eng d
020 _a9781605111292
020 _a1605111295
039 9 _a201304161654
_bhuda
_y201206151503
_zsafura
040 _aUMP
090 _aTK7874.53 .M38 2009
245 0 0 _aMaterials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2009 :
_bsymposium held April 14-17, 2009, San Francisco, California, U.S.A. /
_ceditors, Martin Gall ... [et al.]
260 _aWarrendale, PA :
_bMaterials Research Society,
_c2009
300 _aviii, 189 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposium proceedings ;
_vv. 1156
504 _aIncludes bibliographical references and indexes
650 0 _aInterconnects (Integrated circuit technology)
_vCongresses
650 0 _aIntegrated circuits
_xVery large scale integration
_vCongresses
650 0 _aMicroelectronics
_vCongresses
650 0 _aNanoelectronics
_vCongresses
650 0 _aMaterials
_vCongresses
700 1 _aGall, Martin
830 0 _aMaterials Research Society symposia proceedings ;
_vv. 1156
999 _aVIRTUA40
_c67317
_d67323
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*6503*6504*7000*8300*9992