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008 120615t2012 nyudao f 001 0 eng d
020 _a9781605113128
020 _a1605113123
039 9 _a201304181035
_bhuda
_y201206151507
_zsafura
040 _aUMP
090 _aTK7874.53 .S96 2012
111 2 _aSymposium O, "Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics"
_d(2011 :
_cSan Francisco, Calif.)
245 1 0 _aMaterials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 :
_bsymposium held April 25-29, 2011, San Francisco, California, U.S.A. /
_ceditors, Mikhail R. Baklanov ... [et al.]
260 _aNew York :
_bCambridge University Press,
_c2012
300 _aix, 127 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposium proceedings ;
_vv. 1335
504 _aIncludes bibliographical references and indexes
650 0 _aInterconnects (Integrated circuit technology)
_Integrated circuits
_xVery large scale integration
_vCongressesv Congresses
650 0 _aMicroelectronics
_vCongresses
650 0 _aNanoelectronics
_vCongresses
650 0 _aMaterials
_vCongresses
700 1 _aBaklanov, Mikhail R.
830 0 _aMaterials Research Society symposia proceedings ;
_vv. 1335
999 _aVIRTUA40
_c67890
_d67896
999 _aVTLSSORT0080*0200*0201*0400*0900*1110*2450*2600*3000*4900*5040*6500*6501*6502*6503*7000*8300*9992