000 00884nam a2200253 a 4500
001 vtls000070494
003 KUKTEM
005 20251125093751.0
008 130604t2013 ne a f 001 0 eng d
020 _a9780123971944 (hardback)
039 9 _a201402131113
_bsaini
_y201306041607
_zasmadi
040 _aUMP
090 _aQA277.3 .V65 2013
100 1 _aVoinov, Vassiliy
245 1 0 _aChi-squared goodness of fit tests with applications /
_cV. Voinov, M. Nikulin, N. Balakrishnan
260 _aAmsterdam :
_bElsevier/AP,
_c2013
300 _axii, 229 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index
650 0 _aChi-square test
650 0 _aDistribution (Probability theory)
700 1 _aBalakrishnan, N.
700 1 _aNikulin, M. S.
999 _aVIRTUA40
_c67995
_d68001
999 _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*6501*7000*7001*9992