000 00965nam a2200265 a 4500
001 vtls000071554
003 KUKTEM
005 20251125093754.0
008 130612t2013 gw a f b 001 0 eng d
020 _a9781461461623
039 9 _a201402201529
_bjamie
_y201306121508
_zida
040 _aUMP
090 _aTK7874 .M37 2013
100 1 _aMaricau, Elie
245 1 0 _aAnalog IC reliability in nanometer CMOS /
_cElie Maricau, Georges Gielen
260 _aHeidelberg, Germany :
_bSpringer,
_cc2013
300 _axvi, 198 p. :
_bill. ;
_c24 cm.
490 1 _aAnalog circuits and signal processing
504 _aIncludes bibliographical references and index
650 0 _aLinear integrated circuits
_xReliability
650 0 _aMetal oxide semiconductors, Complementary
700 1 _aGielen, Georges
830 0 _aAnalog circuits and signal processing
999 _aVIRTUA40
_c68047
_d68053
999 _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*4900*5040*6500*6501*7000*8300*9992