000 01280nam a2200289 a 4500
001 vtls000062470
003 KUKTEM
005 20251125093756.0
008 120619t2009 paudao f 001 0 eng d
020 _a9781605110806
020 _a1605110809
039 9 _a201304181459
_bhuda
_y201206191316
_zsafura
040 _aUMP
090 _aTK7871.85 .S96 2008
111 2 _aSymposium A, "Performance and Reliability of Semiconductor Devices"
_d(2008 :
_cBoston, Mass.)
245 1 0 _aPerformance and reliability of semiconductor devices :
_bsymposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. /
_ceditors, Michael Mastro ... [et al.]
260 _aWarrendale, PA :
_bMaterials Research Society,
_c2009
300 _axiii, 259 p. :
_bill. ;
_c24 cm.
490 1 _aMaterials Research Society symposium proceedings ;
_vv. 1108
504 _aIncludes bibliographical references and indexes
650 0 _aSemiconductors
_vCongresses
650 0 _aSemiconductors
_xDefects
_vCongresses
650 0 _aSemiconductors
_xReliability
_vCongresses
700 1 _aMastro, Michael
830 0 _aMaterials Research Society symposia proceedings ;
_vv. 1108
999 _aVIRTUA40
_c68078
_d68084
999 _aVTLSSORT0080*0200*0201*0400*0900*1110*2450*2600*3000*4900*5040*6500*6501*6502*7000*8300*9992