| 000 | 01272nam a2200301 a 4500 | ||
|---|---|---|---|
| 001 | vtls000061985 | ||
| 003 | KUKTEM | ||
| 005 | 20251125093942.0 | ||
| 008 | 120615t1992 paua f b 001 0 eng d | ||
| 020 | _a9781558991606 | ||
| 020 | _a1558991603 | ||
| 039 | 9 |
_a201307101434 _bjamie _c201307101432 _djamie _y201206151045 _zsafura |
|
| 040 | _aUMP | ||
| 090 | _aTK7874 .M38 1992 | ||
| 245 | 0 | 0 |
_aMaterials reliability in microelectronics II : _bsymposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / _ceditors by C. V. Thompson, J. R. Lloyd |
| 260 |
_aPittsburgh, PA : _bMaterials Research Society, _cc1992 |
||
| 300 |
_aix, 328 p. : _bill. ; _c24 cm. |
||
| 490 | 1 |
_aMaterials Research Society symposium proceedings ; _vv. 265 |
|
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aMicroelectronics _xReliability _xCongresses |
|
| 650 | 0 |
_aMicroelectronics _xMaterials _xTesting _xCongresses |
|
| 650 | 0 |
_aElectrodiffusion _xCongresses |
|
| 650 | 0 |
_aMicrostructure _xCongresses _vCongresses |
|
| 700 | 1 | _aThompson, C. V. | |
| 700 | 1 | _aLloyd, J. R. | |
| 830 | 0 | _aMaterials Research Society symposium proceedings | |
| 999 |
_aVIRTUA40 _c69840 _d69846 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*6503*7000*7001*8300*9992 | ||