000 01342nam a2200301 a 4500
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005 20251125095343.0
008 130613t2011 sz a f b 001 0 eng d
020 _a9783037852323
039 9 _a201401271240
_bjamie
_y201306131604
_zfaiz
040 _aUMP
090 _aTK7871.85 .G33 2011
111 2 _aGADEST 2011
_d(2011 :
_cLoipersdorf (Furstenfeld), Austria)
245 1 0 _aGettering and defect engineering in semiconductor technology XIV :
_bselected papers from the 14th International Biannual Meeting on Gettering and Defect Engineering in Semiconductor, (GADEST2011) : September 25-30, 2011, Loipersdorf (Furstenfeld), Austria) /
_cedited by W. Jantsch, F. Schaffler
246 3 _aGettering and defect engineering in semiconductor technology 14
246 3 _aGADEST 2011
260 _aDurnten-Zuerich, Switzerland :
_bTTP,
_cc2011
300 _axii, 520 p. :
_bill. ;
_c25 cm.
490 1 _aSolid state phenomena ;
_vv. 178
504 _aIncludes bibliographical references and index
650 0 _aSemiconductors
_vCongresses
650 0 _aGetters
_vCongresses
700 1 _aJantsch, W.
700 1 _aSchaffler, F.
830 0 _aSolid state phenomena ;
_vv. 178
999 _aVIRTUA40
_c70560
_d70566
999 _aVTLSSORT0080*0200*0400*0900*1110*2450*2460*2461*2600*3000*4900*5040*6500*6501*7000*7001*8300*9992