000 01513nam a2200301 a 4500
001 vtls000074279
003 KUKTEM
005 20251125095450.0
008 130904t2013 sz a f 001 0 eng d
020 _a9783037856819
039 9 _a201405201525
_bsaini
_y201309041056
_zida
040 _aUMP
090 _aQD181.O1 O95 2013
111 2 _aInternational Scientific Conference Oxide Materials for Electronic Engineering - Fabrication, Properties and Applications
_d(2012 :
_cLʹviv, Ukraine)
245 1 0 _aOxide materials for electronic engineering :
_bfabrication, properties and applications /
_cedited by Sergii Ubizskii, Leonid Vasylechko and Yaroslav Zhydachevskii
260 _aDurnten-Zurich :
_bTrans Tech Pub.,
_c2013
300 _axi, 320 p. :
_bill. ;
_c24 cm.
490 0 _aDiffusion and Defect Data, pt. B : Solid State Phenomena ;
_vv. 200
500 _aSelected, peer reviewed papers from the International Scientific Conference Oxide Materials for Electronic Engineering - Fabrication, Properties and Applications (OMEE 2012), September 3-7, 2012, was held in Lviv, Ukraine
504 _aIncludes bibliographical references and index
650 0 _aOxides
_vCongresses
650 0 _aElectrodes, Oxide
_vCongresses
650 0 _aElectrical engineering
_vCongresses
700 1 _aUbizskii, Sergii
700 1 _aVasylechko, Leonid
700 1 _aZhydachevskii, Yaroslav
999 _aVIRTUA40
_c71619
_d71625
999 _aVTLSSORT0080*0200*0400*0900*1110*2450*2600*3000*4900*5000*5040*6500*6501*6502*7000*7001*7002*9992