| 000 | 00875nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | vtls000079848 | ||
| 003 | KUKTEM | ||
| 005 | 20251125095651.0 | ||
| 008 | 140605t2013 nyua f 001 0 eng d | ||
| 020 | _a9781628087253 | ||
| 039 | 9 |
_a201410301511 _bsaini _y201406050949 _znadia |
|
| 040 | _aUMP | ||
| 090 | _aQC793.5.N4628 N48 2013 | ||
| 245 | 0 | 0 |
_aNeutron diffraction : _bprinciples, instrumentation and applications / _cXinzhe Jin, editor |
| 260 |
_aHauppauge, N.Y. : _bNova Science Pub., _c2013 |
||
| 300 |
_a79 p. : _bill. (some col.) ; _c23 cm. |
||
| 490 | 1 | _aMaterials science and technologies | |
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aNeutrons _xDiffraction |
|
| 700 | 1 | _aJin, Xinzhe | |
| 830 | 0 | _aMaterials science and technologies | |
| 999 |
_aVIRTUA40 _c73595 _d73601 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*4900*5040*6500*7000*8300*9992 | ||