000 00992nam a2200277 a 4500
001 vtls000084370
003 KUKTEM
005 20251125095904.0
008 141201t2013 nyua f 001 0 eng d
020 _a9780078035302 (hbk.)
039 9 _a201506031220
_baida
_c201505131332
_daida
_y201412011157
_zazli
040 _aUMP
090 _aBF176 .C64 2013
100 1 _aCohen, Ronald Jay
245 1 0 _aPsychological testing and assessment :
_ban introduction to tests and measurement /
_cRonald Jay Cohen, Mark E. Swerdlik, Edward D. Sturman
250 _a8th ed.
260 _aNew York :
_bMcGraw-Hill,
_cc2013
300 _axv, 612 p. :
_bill. (some col.) ;
_c27 cm.
504 _aIncludes bibliographical references and indexes
650 0 _aPsychological tests
650 0 _aPsychometrics
700 1 _aSwerdlik, Mark E.
700 1 _aD. Sturman, Edward D.
999 _aVIRTUA40
_c75642
_d75648
999 _aVTLSSORT0080*0200*0400*0900*1000*2450*2500*2600*3000*5040*6500*6501*7000*7001*9992
942 0 0 _01